2nd World Congress and Expo on Nanotechnology and Material Science April 04-06, 2016 at Dubai, UAE
Conference Proceedings
Oral In-line Surface Metrology for Roll to Roll Manufacture of Thin Film Barrier
- Hussam Muhamedsalih,
- Liam Blunt,
- Mohamed Elrawemi,
- Haydn Martin,
- Feng Gao,
- X. Jiang,
- Ivo Hamersma,
- David Bird
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Hussam Muhamedsalih
University of Huddersfield
Liam Blunt
University of Huddersfield
Mohamed Elrawemi
University of Huddersfield
Haydn Martin
University of Huddersfield
Feng Gao
University of Huddersfield
X. Jiang
University of Huddersfield
Ivo Hamersma
IBS Precision Engineering, Netherlands
David Bird
Centre for Process Innovation, Sedgefield
Published
January 1, 2018